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agilent U7231A ddr3 compliance test application for infiniium 9000 and 90000 series oscilloscope datasheet
2 test, debug and characterize your ddr3 designs quickly and easily the agilent technologies U7231A ddr3 compliance test application provides a fast and easy way to test, debug and characterize your ddr3 designs. the tests performed by the U7231A software are based on the jedec 1 jesd79-3c ddr3 sdram specification. in addition, the application features advanced debug mode, which covers crucial measurements such as eye-diagram, mask testing, ringing and other tests that are not covered in the specifications but are critical for characterizing ddr3 devices. the test application offers a user-friendly setup wizard and a comprehensive report that includes margin analysis. ddr3 is an evolutionary upgrade to ddr2 and ddr1 memory systems. ddr3 technology enables even higher bandwidth for data transfer than ddr2 and allows you to build devices with even smaller chip footprints that consume less power and generate less heat. ddr3 achieves these advances with enhanced fine ball-grid array (fbga) packaging, enhanced on-die termination, self calibration and automatic self-refresh for improved control of signal integrity. signal integrity is crucial for memory system interoperability. reference clock jitter measurements help you ensure that jitter is well within the specifications, which is the key to reliable and interoperable modular memory systems. at the same time, electrical and timing characteristics of other signals are critical as well, to ensure the memory system functions correctly and stays error free. the U7231A ddr3 compliance test application is compatible with agilent 9000 and 90000 series infiniium digital storage oscilloscopes. 1 the jedec (joint electronic device engineering council) solid state technology association is a semiconductor engineering standardization body of the electronic industries alliance (eia), a trade association that represents all areas of the electronic industry.
3 features the U7231A ddr3 compliance test application offers several features to simplify the validation of your ddr3 designs: ? new setup wizard for quick setup, configuration and test ? enhanced execution speed and proven test algorithm for clock test, which minimizes your compliance test time ? user-selected tests and configurations based on jedec jesd79-3c specification data rate and user-defined speed for embedded designs ? unique technique to provide read-write burst signal separation on the same bus in real-time mode, allowing powerful debug and analysis ? ability to analyze the loading effect of adjacent rank of the same memory channel ? test framework provides powerful characterization through multiple trials that show a full array of statistics for each measurement and returns the worst measurement value ? automatically perform derating table calculations for setup and hold time measurements based on slew rate comprehensive test coverage with the ddr3 compliance test application, you can use the same oscilloscope you use for everyday debugging to perform automated testing and margin analysis based on the jedec electrical and timing specifications. the application automatically configures the oscilloscope for each test and provides informative results. it includes margin analysis indicating how close your device comes to passing or failing the test for each specification. some of the difficulties in performing ddr3 tests are connecting to the target device, configuring the oscilloscope, performing the tests and analyzing the measured results. the ddr3 compliance test application does most of this work for you. if you discover a problem with your device, the advanced debug feature in the test application and debug tools in the oscilloscope are available to aid in root-cause analysis.
4 easy test definition the test application enhances the usability of agilent infiniium oscilloscopes for testing ddr3 devices. the agilent automated test framework guides you quickly through the steps required to define the setup, perform the tests and view the test results. on the environmental setup page, you can select the type of ddr3 devices, and the framework automatically filters the tests based on your selection. you can then select a category of tests or specify individual tests. the user interface is designed to minimize unnecessary reconnections, which saves time and minimizes potential operator error. you can save the tests and configurations as project files and recall them later for quick testing and review of previous results. clear menus let you perform tests with minimum mouse clicks. figure 1. ddr3 application test setup screen. select compliance or advanced debug test mode and the speed grade of your device. figure 2. the agilent automated test engine filters the test selection based on your test setup. you can easily select individual tests or groups of tests with a mouse-click.
5 configurability and guided connection the U7231A ddr3 compliance test application provides flexibility in your test setup. the application lets you define controls for critical test parameters such as voltage threshold values, number of waveforms used for analysis and customizable violation settings. once you have configured the tests, the connection page will display the connection diagram for the test you have selected. with the multiple test trial capability, you can extensively characterize the performance of your ddr3 devices. you can run the selected tests until the stop condition is met. the application will then save the worst-case conditions and help you track down the anomalies in your signals. figure 3. the software prompts you with the connection diagrams for the tests you have selected.
6 comprehensive results analysis in addition to providing you with measurement results, the U7231A ddr3 compliance test application reports how close you are to the specified limit. you can specify the level at which warnings are to be issued. you are provided with a full array of statistics for each measurement, and you can save worst- case conditions to extensively test the performance of your device. figure 4. the repetitive run feature allows you to run the selected tests until the stop condition is met. it allows you to extensively test the performance of your device. figure 5. the ddr3 test application documents your test parameters, pass or fail status, test specification range, measured values and the pass/fail margin.
7 thorough performance reporting the U7231A ddr3 compliance test application generates thorough html reports that capture the performance, status and margins of your device. it also captures screen shots of critical measurements for your reference and documentation. this report is suitable for printing and sharing with your vendors, customers or colleagues. figure 6. the ddr3 test application generates a summary report where you can see your devices test results quickly and clearly. details are available for each test including the test limits, test description and test results, including saved waveforms. in addition, the pass/fail margin is indicated to give you further insight.
8 system device requirements in order to speed your test time, you must use the appropriate ram test reliability software with the memory system to generate random activity on the memory bus. memtest, is commonly used ram reliability test software that can run on dos, windows ? and linux systems. test performed the agilent U7231A ddr3 compliance test application covers clock, electrical and timing parameters of the jedec jesd79-3c ddr3 sdram specifications. the application helps you test all ddr3 devices for compliance, using an agilent 9000 or 90000 series infiniium oscilloscope. in addition, the test applications advanced debug feature provides popular test methodologies that are not covered in any specification. these tests help users who want to perform extensive validation beyond the test specification. it also sets up the scope to isolate the read and write signals so you can immediately jump in to debug the signals. table 1. jedec tests covered by the U7231A test application speed supported specification ddr3-800 ddr3-1066 ddr3-1333 ddr3-1600 ac and dc input measurement levels table 24 C single-ended ac and dc input levels (page 115) xxxx table 25 C differential ac and dc input levels (page 118) xxxx table 27 C single-ended levels for ck, dqs (page 119) xxxx table 28 C cross point voltage for differential input signals (ck, dqs) (page 120) xxxx table 31 C single-ended ac and dc output levels (page 123) xxxx table 32 C differential ac and dc output levels (page 123) xxxx table 34 C output slew rate (single-ended) (page 124) xxxx table 36 C differential output slew rate (page 125) xxxx table 37 C ac overshoot/ undershoot specifications for address and control pins (page 127) xxxx table 38 C ac overshoot/ undershoot specifications for clock, data, strobe and mask (page 128) xxxx electrical characteristics and ac timing table 67 C timing parameters by speed bin (page 164) xxxx table 2. advanced debug feature covered by the U7231A test application measurement items speed supported all jedec tests from compliance mode user configurable read/write eye-diagram test user configurable high/low state ringing test user configurable
9 oscilloscope compatibility the U7231A ddr3 compliance test application is compatible with agilent 9000 or 90000 series oscilloscopes with operation software revision 2.0 or higher and 54850/80000 series oscilloscopes with operation software revision 5.70 or higher (windows xp pro). for oscilloscopes with earlier software revisions, free upgrade software is available at http://www. agilent.com/find/scope-apps-sw. note: 1. recommended 8 ghz bandwidth or greater for full characterization. 2. option 005 noise reduction is recommended for 8-ghz or higher bandwidth oscilloscopes. 3. the jedec jesd79-3c specification does not specify the rise time and fall time for ddr3 signals. the required oscilloscope bandwidth is also not mentioned. it is advisable for you to determine the oscilloscope bandwidth requirement based on the fastest rise time and fall time of the ddr3 signals. please refer to table 3.. for 9000 and 90000 series oscilloscope, you can choose the oscilloscope bandwidth using the calculation below. maximum signal frequency content = 0.4/fastest rise or fall time (20 - 80%) scope bandwidth required = 1.4x maximum signal frequency for 3% accuracy measurement scope bandwidth required = 1.2x maximum signal frequency for 5% accuracy measurement scope bandwidth required = 1.0x maximum signal frequency for 10% accuracy measurement table 3. infiniium 9000 and 90000a series oscilloscope rise/fall time specifications rise time/ fall time 90254a 90404a 90604a 90804a 91204a 91304a 10 C 90% 140 ps 105 ps 70 ps 54 ps 35 ps 32 ps 20 C 80% 105 ps 79 ps 53 ps 38 ps 26 ps 24 ps ddr3 data rate recommended oscilloscope bandwidth sampling rate up to 1600 mt/s 9254a 2.5 ghz 10 gsa/s 9404a 4 ghz 10 gsa/s 90404a 4 ghz 20 gsa/s 90604a 6 ghz 29 gsa/s 90804a 8 ghz 40 gsa/s 91204a 12 ghz 40 gsa/s 91304a 13 ghz 40 gsa/s
10 ordering information to purchase the U7231A ddr3 compliance test application for your new and existing infiniium 9000 or 90000 series oscilloscope, order the following: oscilloscope requirements model number description 9000/90000 or 54850a/80000 infiniiium series scope with software 2.0 or higher infiniiium series scope with software 5.70 or higher U7231A or n5459a ddr3 compliance test application (option 033 on new 9000/90000 series oscilloscope ddr 1, 2 and 3 software bundle option (contain options u7233a, n5413a, U7231A) e2688a high-speed serial data analysis and clock recovery software (option 003 on new 9000 or 90000 series oscilloscopes or option n5435a-003 for application server license) n5414a infiniiscan event identification software (option 009 on new 9000 or 90000 series oscilloscopes or option n5435a-004 for application server license) 116xa/113xa 1, 2 infiniimax i/ii probe amplifier (minimum quantity 3 required) 1 ensure that the probe amplifier meets the bandwidth requirement for your signal measurements. refer to the probe accessories section below to configure the probe head to go with your probe amplifier. 2 for multiple rank testing, a quantity of 4 probes are required for additional probing of chip select (cs) pin. probe accessories infiniimax probe amplifiers model number description 1169a 12-ghz differential probe amplifier 1168a 10-ghz differential probe amplifier 1134a 7-ghz differential probe amplifier 1132a 5-ghz differential probe amplifier infiniimax probe heads model number description n5381a infiniimax ii 12-ghz differential solder-in probe head and accessories n5382a infiniimax ii 12-ghz differential browser e2677a infiniimax 12-ghz differential solder-in probe head and accessories e2675a infiniimax 6-ghz differential browser probe head and accessories n5425a infiniimax 12-ghz zif probe head n5426a zif tips (x10) n5451a long wire tips (x10)
11 related literature publication title publication type publication number agilent infiniium dso/dsa 90000a series oscilloscopes and infiniimax probes data sheet 5989-7819en infiniium dso80000b series oscilloscopes and infiniimax series probes data sheet 5989-4606en agilent infiniiscan event identification software for infiniium 80000 and 8000 series oscilloscopes (n5414a and 5415a) data sheet 5989-4605en agilent technologies e2688a, n5384a high-speed serial data analysis and clock recovery software for infiniium 54830, 54850 and 80000 series oscilloscopes data sheet 5989-0108en agilent technologies ezjit and ezjit plus jitter analysis software for infiniium series oscilloscopes data sheet 5989-0109en w2635a and w2636a ddr3 bga probe adapter for infiniium oscilloscopes data sheet 5989-0109en a time-saving method for analyzing signal integrity in ddr memory buses application note 5989-6664en w3630a series ddr3 bga probes for logic analyzers and oscilloscopes data sheet 5990-3179en product web site for the most up-to-date and complete application and product information, please visit our product web site at: www.agilent.com/find/U7231A ddr3 bga probe adapters figure 8. probing of ddr3 signals with ddr3 bga probe adapter and zif tips model number description w2635a-010 x4 and x8, 10mm width ddr3 bga probe adapter for oscilloscopes w2635a-011 x4 and x8, 11mm width ddr3 bga probe adapter for oscilloscopes w2636a-010 x16, 10mm width ddr3 bga probe adapter for oscilloscopes w2636a-011 x16, 11mm width ddr3 bga probe adapter for oscilloscopes w2631a x16 ddr3 bga probe for oscilloscopes and logic analyzers w3633a x4, x8 ddr3 bga probe for oscilloscopes and logic analyzers w2639a scope adapter board for ddr3 bga probe
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